Events, articles, or annoncements from the laboratory.
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Diffusion dans le verre dans ‘Reflets de la physique’
L’année 2022, proclamé l’année internationale du verre par l’ONU, était honoré par l’ouvrage ‘Reflets de la physique’.
Journées plénières du GdR SLAMM
Journées plénières du GdR SLAMM
Conference NANOP 2022
Iryna Gozhyk is participating to Nanophotonics and Micro/Nano Optics International Conference 2022NANOP 2022: Functional Nanophotonics, which will take place on 25-27 October in Paris.
Conférence internationale Matériaux 2022
3 chercheurs représentent SVI à la Conférence Internationale des Matériaux, que a lieu à Lille de 24 au 28 Octobre 2022.
Master Interships
5 Internships at the level Master2 or 3rd year ingineer in topics of Physics, or Chemistry
Copermix workshop at ICTP
Pierre Jop is participating to a week (17-21 october) of Workshop on Mixing in Action. The workshop is organized by the European Copermix project at the International Center for Theoretical Physics.
Félicitations à Anais Verron pour le prix du 1er poster à l' USTV Journées Verre 2022
Journées Verre 2022
PhD defenses
PhD defenses 2022/2023
PhD positions
Our lab is again offering 1 PhD position: check the Careers page
New article: A new method for high resolution curvature measurement applied to stress monitoring in thin films
By combining the well-known grid reflection method with a digital image correlation algorithm and a geometrical optics model, a new method is proposed for measuring the change of curvature of a smooth reflecting substrate, a common reporter of stress state of deposited layers. This tool, called Pattern Reflection for Mapping of Curvature (PReMC), can be easily implemented for the analysis of the residual stress during deposition processes and is sufficiently accurate to follow the compressive-tensile-compressive stress transition during the sputtering growth of a Ag film on a Si substrate. Unprecedented resolution below 10−5 m−1 can be reached when measuring a homogeneous curvature. A comparison with the conventional laser-based tool is also provided in terms of dynamical range and resolution. In addition, the method is capable of mapping local variations in the case of a non-uniform curvature as illustrated by the case of a Mo film of non-uniform film thickness under high compressive stress. PReMC offers interesting perspectives for in situ accurate stress monitoring in the field of thin film growth.