Advanced tools and characterization methods

Our activities are supported by advanced Raman spectroscopy, in-situ XPS, real-time characterization of sputtered materials, BRDF, AFM with hot plate, ...

  • Our Raman spectrometer equipped with accurate translation stages compatible with high-resolution mappings

ADVANCED RAMAN SPECTROSCOPY FOR HETEROGENEOUS SYSTEMS AND THIN FILMS

MISSTIC: A MULTI-TOOL PVD CHAMBER

At SVI we have developed over the years a vacuum system that combines in-situ several deposition sources (three sputtering sources and an evaporation cell) and varius characterization methods that can access the properties of the deposited layers both in real-time (surface reflectance, resistivity, stress) and after the deposition (XPS, UPS, LEED …).

Under the exotic name of MISSTIC, acronym for Multilayers and Interfaces Sputtered-deposition on STructured substrates and In-situ Characterization, the multi-tool is composed of two main chambers connected by a common load lock and transfer arms. It is also equipped for post deposition thermal annealing under controlled atmosphere, ion bombardment, electron beam furnace and oxygen shower.

See also in «Research»

Glass, surfaces and thin films Glass and thin film surfaces, interfaces and nanostructures: understanding processes, physico-chemical interactions, multicomponent diffusion and microstructure towards the design of new materials and products with new functionalities. Optical properties of structured surfaces Optical properties of micro and nano-structured media (nanoparticles, thin films, patterned surfaces, heterogeneities): link between process parameters and morphological and optical properties of complex media. Laser induced heat propagation in thin film and substrates. Soft matter, liquid films, mixing granular materials Develop fundamental knowledge and tools on the behaviour of multiphase systems involved in the processes of building materials, and on the dynamics of liquids and suspensions used in wet coatings processes